Method for measuring a semiconductor structure, which is a solar cell or a precursor of a solar cell

Details for Australian Patent Application No. 2010288982 (hide)

Owner Albert-Ludwigs-Universitat Freiburg Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e. V.

Inventors Haunschild, Jonas; Rein, Stefan; Glatthaar, Markus

Agent Ahearn Fox

Pub. Number AU-A-2010288982

PCT Pub. Number WO2011/023312

Priority 10 2009 039 399.4 31.08.09 DE

Filing date 16 August 2010

Wipo publication date 3 March 2011

International Classifications

G01N 21/64 (2006.01) Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light - Fluorescence

G01N 21/66 (2006.01) Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light

G01R 31/26 (2006.01) Arrangements for testing electric properties - Testing of individual semiconductor devices

H01L 21/66 (2006.01) Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof - Testing or measuring during manufacture or treatment

Event Publications

9 February 2012 PCT application entered the National Phase

  PCT publication WO2011/023312 Priority application(s): WO2011/023312

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