A SAMPLE ENCLOSURE FOR A SCANNING ELECTRON MICROSCOPE AND METHODS OF USE THEREOF

Details for Australian Patent Application No. 2003288487 (hide)

International Classifications

Event Publications

1 April 2004 Complete Application Filed

Priority application(s): PCT/IL03/00454 01.06.03 IL; PCT/IL03/00457 01.06.03 IL; 60/448,808 20.02.03 US

14 October 2004 Application Open to Public Inspection

Published as AU-A-2003288487

3 November 2005 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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