ELECTRONIC PART TEST APPARATUS

Details for Australian Patent Application No. 2002349755 (hide)

Owner ADVANTEST CORPORATION OKUDA, Hiroshi KIYOKAWA, Toshiyuki NAKAJIMA, Haruki

Inventors KIYOKAWA, Toshiyuki; NAKAJIMA, Haruki; OKUDA, Hiroshi

Pub. Number AU-A-2002349755

PCT Number PCT/JP02/12663

PCT Pub. Number WO2003/075023

Priority PCT/JP02/02141 07.03.02 JP

Filing date 3 December 2002

Wipo publication date 16 September 2003

International Classifications

G01R 031/26 Arrangements for testing electric properties - Testing of individual semiconductor devices

Event Publications

13 March 2003 Complete Application Filed

  Priority application(s): PCT/JP02/02141 07.03.02 JP

23 October 2003 Application Open to Public Inspection

  Published as AU-A-2002349755

25 November 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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