IMPROVED SPATIAL WAVEFRONT ANALYSIS AND 3D MEASUREMENT

Details for Australian Patent Application No. 2002339712 (hide)

Owner NANO-OR TECHNOLOGIES (ISRAEL) LTD.

Inventors WEITZMAN, Yosi; SABAN, Yoram; LANZMANN, Emmanuel; LEVAVI, Shay; ARIELI, Yoel; WOLFLING, Shay; BANITT, David

Pub. Number AU-A-2002339712

PCT Number PCT/IL02/00833

PCT Pub. Number WO2003/062743

Priority 60/406,593 27.08.02 US; 60/351,753 24.01.02 US

Filing date 16 October 2002

Wipo publication date 2 September 2003

International Classifications

G01B 009/02 Instruments as specified in the subgroups and characterised by the use of optical measuring means - Interferometers

Event Publications

27 February 2003 Complete Application Filed

  Priority application(s): 60/406,593 27.08.02 US; 60/351,753 24.01.02 US

18 September 2003 Application Open to Public Inspection

  Published as AU-A-2002339712

14 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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