METHOD AND SYSTEM FOR MEASURING PROFILE OF LARGE-AREA USING POINT DIFFRACTION LIGHT SOURCE BASED ON MULTILATERATION

Details for Australian Patent Application No. 2002319927 (hide)

Owner KAIST

Inventors KIM, Seung-Woo; KIM, Byung-Chang

Pub. Number AU-A-2002319927

PCT Number PCT/KR02/01333

PCT Pub. Number WO2003/064971

Priority 2002-0005062 29.01.02 KR

Filing date 15 July 2002

Wipo publication date 2 September 2003

International Classifications

G01B 011/24 Measuring arrangements characterised by the use of optical means - for measuring contours or curvatures

Event Publications

16 January 2003 Complete Application Filed

  Priority application(s): 2002-0005062 29.01.02 KR

18 September 2003 Application Open to Public Inspection

  Published as AU-A-2002319927

14 October 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

  This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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