METHOD FOR MEASURING THE MI- CRORELIEF OF AN OBJECT AND OPTICAL CHARACTERISTICS OF NEAR-SURFACE LAYER, MODULATION INTERFERENCE MICROSCOPE FOR CARRYING OUT SAID METHOD

Details for Australian Patent Application No. 2001248933 (hide)

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Event Publications

6 February 2003 Application Open to Public Inspection

Published as AU-A-2001248933

5 February 2004 Application Lapsed, Refused Or Withdrawn, Patent Ceased or Expired

This application lapsed under section 142(2)(f)/See Reg. 8.3(3). Examination has not yet been requested or directed for this application. Note that applications or patents shown as lapsed or ceased may be restored at a later date.

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